Browsing Research Articles (Physics) by Author "Oliphant, C.J."
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Evolution of the chemical composition of Sn thin films heated during x-ray photoelectron spectroscopy
Modiba, F.; Arendse, C.J.; Oliphant, C.J.; Jordaan, W. A.; Mostert, L (2019)High-vacuum XPS have been used to analyse the surface modification of a 3 nm-thick Sn thin film on Si (100) before and after annealing up to 450 °C. Increasing the XPS stage temperature led to a reduction in the amount of ...