Reflectivity of VUV-sensitive silicon photomultipliers in liquid Xenon
Abstract
Silicon photomultipliers are regarded as a very promising technology for nextgeneration,
cutting-edge detectors for low-background experiments in particle physics. This work
presents systematic reflectivity studies of Silicon Photomultipliers (SiPM) and other samples in
liquid xenon at vacuum ultraviolet (VUV) wavelengths. A dedicated setup at the University of
Münster has been used that allows to acquire angle-resolved reflection measurements of various
samples immersed in liquid xenon with 0 45 angular resolution. Four samples are investigated in
this work: one Hamamatsu VUV4 SiPM, one FBK VUV-HD SiPM, one FBK wafer sample and
one Large-Area Avalanche Photodiode (LA-APD) from EXO-200.